Interaction of very low energy electron beams with micro porous silicon substrates: ESD studies of H−ion desorption-Reference-Cited by-同舟云学术

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Interaction of very low energy electron beams with micro porous silicon substrates: ESD studies of H−ion desorption

Published:2004-11 Issue:2 Volume:28 Page:165-171
ISSN:1286-0042
Container-title:The European Physical Journal Applied Physics
language:
Short-container-title:Eur. Phys. J. Appl. Phys.

Author:

Hadj Zoubir N.,Bernheim M.

Publisher

EDP Sciences

Subject

Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://www.epjap.org/10.1051/epjap:2004190/pdf

Reference25 articles.

1. J.-C. Vial, J. Derrien,Porous Silicon Science and Technology, Les Houches, winter school(Les Éditions de Physique, Springer, 1994)

2. Evidence for hydrogen incorporation during porous silicon formation

3. Optical properties of porous silicon

4. Porous silicon: a quantum sponge structure for silicon based optoelectronics

5. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structure effects in secondary ion emission of metals and alloys;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2011-06

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