On the generation of test patterns for multiple faults

Author:

Aboulhamid El Mostapha,Karkouri Youn�s,Cerny Eduard

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Reference38 articles.

1. H. Fujiwara, ?Computational complexity of controllability/observability problems for combinational circuits,?Proc. of the 18th Fault-Tolerant Computing Symp., pp. 46?69, 1988.

2. O.H. Ibarra and S.K. Sahni, ?Polynomially Complete Fault Detection Problems,?IEEE Trans. on Computers, vol. C-24, pp. 242?249, March 1975.

3. Y. Karkouri and E.M. Aboulhamid, ?Complexité du test des circuits logiques,?Technique et Science Informtiques, vol. 9, pp. 273?287, April 1990.

4. M.A. Breuer and A.D. Friedman,Diagnosis & Reliable Design of Digital Systems, Computer Science Press, 1976.

5. J.P. Shen, W. Maly, and F.J. Ferguson, ?Inductive fault analysis of MOS integrated circuits,?IEEE Design & Test of Computers, vol. 2, pp. 13?26, February 1985.

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. ATPG-based grading of strong fault-secureness;2009 15th IEEE International On-Line Testing Symposium;2009-06

2. NOVEL TEST GENERATION ALGORITHM FOR COMBINATION CIRCUITS;Journal of Circuits, Systems and Computers;2000-02

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