Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
127 articles.
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1. Efficient and Effective Neural Networks for Automatic Test Pattern Generation;Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD;2024-09-09
2. A High Performance PODEM Algorithm with the Improved Backtrace Process;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18
3. An Amalgamated Testability Measure Derived from Machine Intelligence;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
4. Intelligent Automatic Test Pattern Generation for Digital Circuits Based on Reinforcement Learning;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14
5. Basics of VLSI Testing and Debug;Understanding Logic Locking;2023-09-23