Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis-Reference-Cited by-同舟云学术

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Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis

Published:2002-10 Issue:5 Volume:25 Page:435-441
ISSN:0250-4707
Container-title:Bulletin of Materials Science
language:en
Short-container-title:Bull Mater Sci

Author:

Tiwari M. K.,Gowrishankar B.,Raghuvanshi V. K.,Nandedkar R. V.,Sawhney K. J. S.

Publisher

Springer Science and Business Media LLC

Subject

Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF02708023.pdf

Reference20 articles.

1. Aiginger H and Wobrauschek P 1974Nucl. Instrum. Meth. 114 157

2. Awaji Net al 2000Jap. J. Appl. Phys. Lett. 39 L1252

3. Knoth J and Schwenke H 1978Fresenius Z. Anal. Chem. 291 200

4. Kregsamer P, Streli C, Wobrauschek P, Gatterbauer H, Pianetta P, Palmetshofer L and Brehm L Lora 1999X-ray Spectrom. 28 292

5. Klockenkamper R 1997 inTotal-reflection X-ray fluorescence analysis (New York: John Wiley and Sons, Inc.) Ch. 3 pp 87–105

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