Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8-Reference-Cited by-同舟云学术

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Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8

Published:2000-12-01 Issue:Part 2, No. 12A Volume:39 Page:L1252-L1255
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Awaji Naoki,Ozaki Shinji,Nishino Junichi,Noguchi Sinichi,Yamamoto Tohru,Syoji Takashi,Yamagami Motoyuki,Kobayashi Akira,Hirai You,Shibata Masahiro,Yamaguchi Koji,Liu Kuang-Yu,Kawado Seiji,Takahashi Mamoru,Yasuami Shigeru,Konomi Ichiro,Kimura Shigeru,Hirai Yasuharu,Hasegawa Masaki,Komiya Satoshi,Hirose Takayuki,Okajima Toshihiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray absorption spectroscopy without the self-absorption effect by detecting l-line fluorescence at the K-edge;Applied Surface Science;2023-01

2. An IAEA multi-technique X-ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications;Journal of Synchrotron Radiation;2018-01-01

3. Trace elemental determination by portable total reflection X-ray fluorescence spectrometer with low wattage X-ray tube;X-Ray Spectrometry;2013-02-21

4. Application of a Portable Total Reflection X-Ray Fluorescence Spectrometer to a Trace Elemental Analysis of Wines;BUNSEKI KAGAKU;2009

5. 10.4139/sfj.60.566;Journal of The Surface Finishing Society of Japan;2009

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