Synchrotron radiation-excited glancing incidence xrf for depth profile and thin-film analysis of light elements
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference9 articles.
1. Total reflection X-ray fluorescence analysis of light elements with synchrotron radiation and special X-ray tubes
2. A new spectrometer for total reflection X-ray fluorescence analysis of light elements
3. Synchrotron-based X-ray lithography at Stanford University
4. Doctoral Thesis, Technische Universität Wien (1995).
5. Analysis of Thin Films and Multi-Layer Thin Films containing Light Elements by XRF
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