Quantitative Strain Analysis of the Large Deformation at the Scale of Microstructure: Comparison between Digital Image Correlation and Microgrid Techniques
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Aerospace Engineering
Link
http://link.springer.com/content/pdf/10.1007/s11340-012-9612-6.pdf
Reference45 articles.
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3. Jin H, Lu W-Y, Korellis J (2008) Micro-scale deformation measurement using the digital image correlation technique and scanning electron microscope image. J Strain Anal Eng 43(8):719–728
4. Quinta Da Fonseca J, Mummery PM, Withers PJ (2005) Full-field strain mapping by optical correlation of micrographs acquired during deformation. J Microsco 218(1):9–21
5. Kang J, Jain M, Wilkinson DS, Embury JD (2005) Microscopic strain mapping using scanning electron microscopy topography image correlation at large strain. J Strain Anal 4(6):559–570
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