High-resolution photoemission yield and surface states in semiconductors
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Medicine
Link
http://link.springer.com/content/pdf/10.1007/BF02725822.pdf
Reference13 articles.
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5. C. Sebenne, D. Bolmont, G. Guichar andM. Balkanski:Proceedings of the II International Conference on Solid Surfaces, Japan Journ. Appl. Phys., Suppl. 2, part 2 (1974), p. 405;Phys. Rev. B,12, 3280 (1975).
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