Polycrystalline Silicon Thin-Films Formed by the Aluminum-Induced Layer Exchange (ALILE) Process-Reference-Cited by-同舟云学术

Polycrystalline Silicon Thin-Films Formed by the Aluminum-Induced Layer Exchange (ALILE) Process

Published:2009 Issue: Volume: Page:193-218
ISSN:1435-1889
Container-title:Advances in Materials Research
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Author:

Gall Stefan

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-02044-5_12.pdf

Reference76 articles.

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