Electronic Properties of Stacking Faults and Thin Cubic Inclusions in SiC Polytypes-Reference-Cited by-同舟云学术

Electronic Properties of Stacking Faults and Thin Cubic Inclusions in SiC Polytypes

Published:2004 Issue: Volume: Page:89-118
ISSN:1439-2674
Container-title:Silicon Carbide
language:
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Author:

Lindefelt U.,Iwata H.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-18870-1_4.pdf

Reference41 articles.

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