Reaching Coverage Closure in Post-silicon Validation-Reference-Cited by-同舟云学术

Reaching Coverage Closure in Post-silicon Validation

Published:2011 Issue: Volume: Page:60-75
ISSN:0302-9743
Container-title:Hardware and Software: Verification and Testing
language:
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Author:

Adir Allon,Nahir Amir,Ziv Avi,Meissner Charles,Schumann John

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-19583-9_10

Reference19 articles.

1. Wile, B., Goss, J.C., Roesner, W.: Comprehensive Functional Verification - The Complete Industry Cycle. Elsevier, Amsterdam (2005)

2. ITRS: International technology roadmap for semiconductors 2007 edn. - design (2007), http://www.itrs.net/Links/2007ITRS/2007_Chapters/2007_Design.pdf

3. Rotithor, H.G.: Postsilicon validation methodology for microprocessors. IEEE Design & Test of Computers 17(4), 77–88 (2000)

4. Abramovici, M., Bradley, P., Dwarakanath, K., Levin, P., Memmi, G., Miller, D.: A reconfigurable design-for-debug infrastructure for socs. In: Proceedings of the 43rd Design Automation Conference, pp. 7–12 (2006)

5. Chang, K.h., Markov, I.L., Bertacco, V.: Automating post-silicon debugging and repair. In: Proceedings of the 2007 International Conference on Computer-Aided Design, pp. 91–98 (2007)

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