Author:
Espinosa Jaime,de Andrés David,Ruiz Juan-Carlos,Gil Pedro
Publisher
Springer Berlin Heidelberg
Reference25 articles.
1. Narayanan, V., Xie, Y.: Reliability concerns in embedded systems design. IEEE Computer 1(39), 118–120 (2006)
2. Lecture Notes in Computer Science;O. Hannius,2012
3. Borkar, S.: Designing reliable systems from unreliable components: the challenges of transistor variability and degradation. IEEE Micro 25(6), 10–16 (2005)
4. JEDEC: Measurement and reporting of alpha particle and terrestrial cosmic ray-induced soft errors in semiconductor devices. JEDEC Standard JESD89A. JEDEC (2006)
5. Gracia-Moran, J., Gil-Tomas, D., Saiz-Adalid, L.J., Baraza, J.C., Gil-Vicente, P.J.: Experimental validation of a fault tolerant microcomputer system against intermittent faults. In: DSN, pp. 413–418 (2010)
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