Author:
Hannius Olof,Karlsson Johan
Publisher
Springer Berlin Heidelberg
Reference14 articles.
1. Chandra, V., Aitken, R.: Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. In: IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems (DFTVS 2008), pp. 114–122 (October 2008)
2. Ibe, E., Taniguchi, H., Yahagi, Y., Shimbo, K.S., Toba, T.: Impact of scaling on neutron-induced soft error in SRAMs from a 250 nm to a 22 nm design rule. IEEE Transactions on Electron Devices 57(7), 1527–1538 (2010)
3. Benso, A., Di Carlo, S., Di Natale, G., Prinetto, P.: A watchdog processor to detect data and control flow errors. In: 9th IEEE International On-Line Testing Symposium, pp. 144–148 (July 2003)
4. Jahinuzzaman, S.M., Sharifkhani, M., Sachdev, M.: Investigation of process impact on soft error susceptibility of nanometric SRAMs using a compact critical charge model. In: 9th International Symposium of Quality Electronic Design (2008)
5. Islam, A.E., Kufluoglu, H., Varghese, D., Mahapatra, S., Alam, M.A.: Recent issues in negative-bias temperature instability: Initial degradation, field dependence of interface trap generation, hole trapping effects and relaxation. IEEE Trans. Electron Devices 54(9), 2143–2154 (2007)
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