A Formal Study of Power Variability Issues and Side-Channel Attacks for Nanoscale Devices

Author:

Renauld Mathieu,Standaert François-Xavier,Veyrat-Charvillon Nicolas,Kamel Dina,Flandre Denis

Publisher

Springer Berlin Heidelberg

Cited by 115 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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