Publisher
Springer Berlin Heidelberg
Reference7 articles.
1. J.B. Clegg, J. Appl. Phys. 53 4518 (1982)
2. W. Kütt, D. Bimberg, M.Maier, H. Kräutle, F. Köhl, E. Tomzig, Appl. Phys. Lett. 45 489 (1985)
3. R.N. Thomas, H.M. Hobgood, G.W. Eldridge, D.L. Barett, T.T. Braggins, Solid State Electronics 24 387 (1981)
4. R.G. Wilson, P.K. Vasudev, D.M. Jamda, C.A. Evans, Jr V.R. Deline, Appl. Phys. Lett. 46 215 (1980)
5. A.M. Huber, G. Morillot, A. Friederich, “Secondary Ion Mass Spectrometry” SIMS IV. Osaka 36 278 Springer-Verlag Ed (1983)
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献