When Failure Analysis Meets Side-Channel Attacks-Reference-Cited by-同舟云学术

When Failure Analysis Meets Side-Channel Attacks

Published:2010 Issue: Volume: Page:188-202
ISSN:0302-9743
Container-title:Cryptographic Hardware and Embedded Systems, CHES 2010
language:
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Author:

Di-Battista Jerome,Courrege Jean-Christophe,Rouzeyre Bruno,Torres Lionel,Perdu Philippe

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-15031-9_13.pdf

Reference25 articles.

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4. Barton, D.L., Tangyunyong, P., Soden, J.M., Liang, A.Y., Low, F.J., Zaplatin, A.N., Shivanandan, K., Donohoe, G.: Infrared Light Emission from Semiconductor Devices. In: 22th International Symposium for Testing and Failure Analysis, pp. 9–17 (1996)

5. Ferrigno, J., Hlavac, M.: When AES Blinks: Introducing Optical side-channel. IET Information Security 2(3), 94–98 (2008)

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