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Characterization of foreign grain on 6H-SiC facet

  • Published:2009-06 Issue:3 Volume:16 Page:344-348
  • ISSN:1005-9784
  • Container-title:Journal of Central South University of Technology
  • language:en
  • Short-container-title:J. Cent. South Univ. Technol.

Author:

Wang Ying-min,Li Juan,Ning Li-na,Gao Yu-qiang,Hu Xiao-bo,Xu Xian-gang

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrically tunable optical refractive index of a WS2 film on a SiC substrate;Optical Engineering;2020-01-28

2. WS2 film on a SiC substrate and its optical properties;Optical Engineering;2019-09-30

3. Investigation on tuning of WS2/SiC band gap with an external electric field;Tenth International Conference on Thin Film Physics and Applications (TFPA 2019);2019-07-08

4. Physical Vapor Transport Growth of 4H-SiC on {000-1} Vicinal Surfaces;Materials Science Forum;2015-06
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