Sequential fault diagnosis strategy with imperfect tests considering life cycle cost
Author:
Publisher
Springer Science and Business Media LLC
Subject
Metals and Alloys,General Engineering
Link
http://link.springer.com/content/pdf/10.1007/s11771-013-1876-1.pdf
Reference29 articles.
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4. RAGHAVAN V, SHAKERI M, PATTIPATI K R. Test sequencing problems arising in test planning and design for testability [J]. IEEE Transactions on Systems, Man, and Cybernetics-Part A: Systems and Humans, 1999, 29(2): 153–163.
5. RAGHAVAN V, SHAKERI M, PATTIPATI K. Test sequencing algorithms with unreliable tests [J]. IEEE Transactions on Systems, Man, and Cybernetics-Part A: Systems and Humans, 1999, 29(4): 347–357.
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