Optimal and near-optimal test sequencing algorithms with realistic test models-Reference-Cited by-同舟云学术

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Optimal and near-optimal test sequencing algorithms with realistic test models

Published:1999 Issue:1 Volume:29 Page:11-26
ISSN:1083-4427
Container-title:IEEE Transactions on Systems, Man, and Cybernetics - Part A: Systems and Humans
language:
Short-container-title:IEEE Trans. Syst., Man, Cybern. A

Author:

Raghavan V.,Shakeri M.,Pattipati K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Human-Computer Interaction,Control and Systems Engineering,Software

Link

http://xplorestaging.ieee.org/ielx4/3468/15875/00736357.pdf?arnumber=736357

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