Application of pattern recognition methods in secondary ion mass spectrometry-Reference-Cited by-同舟云学术

Application of pattern recognition methods in secondary ion mass spectrometry

Published:1986-01 Issue:1-6 Volume:89 Page:313-324
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Wilhartitz Peter,Grasserbauer Manfred

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01207325.pdf

Reference11 articles.

1. A. Benninghoven, in:Secondary Ion Mass Spectrometry II (Springer Series in Chemical Physics, Vol. 9), (A. Benninghoven, C. A. Evans, R. A. Powell, R. Shimizu, H. A. Storms, eds.), Springer, Berlin-Heidel-berg-New York, 1979, p. 116.

2. R. Kelly,Nucl. Instr. Meth. 1983,209/210, 509.

3. R. J. Colton,J. Vac. Sci. Techn. 1981,18, 737.

4. H. W. Werner,Vacuum 1974,24/10, 439.

5. A. E. Morgan, H. W. Werner,Appl. Phys. 1976,11, 193.

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