Elemental trace analysis of surfaces and interfaces: goals, accomplishments and challenges-Reference-Cited by-同舟云学术

Elemental trace analysis of surfaces and interfaces: goals, accomplishments and challenges

Published:1990-10-15 Issue:1628 Volume:333 Page:113-132
ISSN:0962-8428
Container-title:Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences
language:en
Short-container-title:Phil. Trans. R. Soc. Lond. A

Author:

Abstract

This paper describes an analytical approach to quantitative trace element analysis with SIMS and demonstrates the potential and limitations of this method for ultra trace bulk analysis, micro- and nanoanalysis of interface regions and surface analysis of high technology materials. Future challenges for methodological research are presented.

Publisher

The Royal Society

Subject

Pharmacology (medical),Complementary and alternative medicine,Pharmaceutical Science

Link

https://royalsocietypublishing.org/doi/pdf/10.1098/rsta.1990.0142

Reference47 articles.

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