Semiquantitative analyses by secondary ion mass spectrometry using one fitting parameter-Reference-Cited by-同舟云学术

Semiquantitative analyses by secondary ion mass spectrometry using one fitting parameter

Published:1978-01 Issue:1-2 Volume:70 Page:31-50
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Morgan A. E.,Werner H. W.

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01196466.pdf

Reference14 articles.

1. H. W. Werner, Surface Sci.47, 301 (1975); J. W. Colby, Practical Scanning Electron Microscopy (Eds. J. I. Goldstein and H. Yakowitz), Chap. XIV, New York: Plenum. 1975. p. 529.

2. C. A. Andersen and J. R. Hinthorne, Science175, 853 (1972); Analyt. Chemistry45, 1421 (1973); C. A. Andersen, Natl. Bur. Stand. (U. S.) Spec. Publ.427, 79 (1975).

3. A. E. Morgan and H. W. Werner, Analyt. Chemistry48, 699 (1976).

4. R. Shimizu, T. Ishitani, and Y. Ueshima, Japan J. Appl. Phys.13, 249 (1974); R. Shimizu, T. Ishitani, T. Kondo, and H. Tamura, Analyt. Chemistry47, 1020 (1975).

5. F. G. R�denauer and W. Steiger, Japan J. Appl. Phys. Suppl.2, Pt. 1, 383 (1974); Vacuum26, 537 (1976).

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