Application of secondary ion mass spectrometry for analyzing the composition and structure of surface layers of fine materials-Reference-Cited by-同舟云学术

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Application of secondary ion mass spectrometry for analyzing the composition and structure of surface layers of fine materials

Published:2010-12 Issue:S1 Volume:51 Page:53-58
ISSN:0022-4766
Container-title:Journal of Structural Chemistry
language:en
Short-container-title:J Struct Chem

Author:

Ivanov V. P.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Inorganic Chemistry,Physical and Theoretical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s10947-010-0189-6.pdf

Reference26 articles.

1. V. T. Cherepin and M. A. Vasiliev, Secondary Ion-Ion Emission from Metals and Alloys [in Russian], Naukova Dumka, Kiev (1975).

2. H. Werner, in: Electron and Ion Spectroscopy of Solids, L. Fiermans, J. Vennik, and W. Dekeyser (eds.), Plenum Press, New York (1978).

3. V. I. Nefedov and V. T. Cherepin, Physical Methods for Investigation of Solid Surface [in Russian], Nauka, Moscow (1983).

4. A. Benninghoven, F. G. Rüdenauer, and H. W. Werner, Secondary Ion Mass Spectrometry, Basic Concepts, Instrum. Aspects, Applications, Wiley, New York (1987).

5. J. Grams, New Trends and Potentialities of TOF-SIMS in Surface Studies, New Science Publisher, New York (2007).

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