Separation of silicon wafers by the smart-cut method
Author:
Affiliation:
1. CEA/LETI- Département de Microtechnologies, 17 rue des Martyrs, 38054 Grenoble Cedex, France Fax:
Publisher
Informa UK Limited
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
https://www.tandfonline.com/doi/pdf/10.1007/s100190050119
Reference16 articles.
1. Colinge JP (ed) Silicon on insulator technology-materials to VLSI, 2nd edn. Kluwer Academic Publishers, Boston
2. Application of hydrogen ion beams to Silicon On Insulator material technology
3. Plasma Contamination and Wall Erosion in Thermonuclear Reactors
4. An interbubble fracture mechanism of blister formation on helium-irradiated metals
Cited by 46 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Xenon Nanobubbles and Residual Defects in Annealed Xe‐Implanted Si(001): Analysis by the Combination of Advanced Synchrotron X‐Ray Diffraction and Transmission Electron Microscopy Techniques;Advanced Materials Technologies;2024-04-18
2. Fabrication and characterization of silicon-on-insulator wafers;Micro and Nano Systems Letters;2023-11-13
3. Fabrication of Crystalline Si Thin Films for Photovoltaics;physica status solidi (RRL) – Rapid Research Letters;2022-10-07
4. Hydrogen effects at sputtered Tb-doped AlNxOy:H / c-Si(p) interfaces: A transient surface photovoltage spectroscopy study;Thin Solid Films;2022-10
5. Comparative Study on the Quality of Microcrystalline and Epitaxial Silicon Films Produced by PECVD Using Identical SiF4 Based Process Conditions;Materials;2021-11-17
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3