Author:
Lin Hui,Li Bin,Wang Xinggang,Shu Yufeng,Niu Shuanglong
Funder
The 8th batch of 3551 Optics Valley Talent Schema in East Lake Hi-tech Zone- LED chip automatic detection sorting key technology and sets of equipment development and industrialization
Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence,Industrial and Manufacturing Engineering,Software
Reference28 articles.
1. Chang, C. Y., Chang, C. H., Li, C. H., & De Jeng, M. (2007). Learning vector quantization neural networks for LED wafer defect inspection. In Second international conference on innovative computing, information and control, 2007. ICICIC ’07, p. 229.
2. Choi, K. J., Lee, Y. H., Moon, J. W., Park, C. K., & Harashima, F. (2007). Development of an automatic stencil inspection system using modified Hough transform and fuzzy logic. IEEE Transactions on Industrial Electronics, 54(1), 604–611.
3. Deng, J., et al. (2009). ImageNet: A large-scale hierarchical image database. In IEEE conference on computer vision and pattern recognition, pp. 248–255.
4. Everingham, M., Gool, L. V., & Williams, C. K. I. (2010). The pascal visual object classes (VOC) challenge. International Journal of Computer Vision, 88(2), 303–338.
5. Hinton, G. E., Srivastava, N., Krizhevsky, A., Sutskever, I., & Salakhutdinov, R. R. (2012). Improving neural networks by preventing co-adaptation of feature detectors. arXiv preprint.
Cited by
155 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献