Automated catastrophic optical damage inspection of semiconductor laser chip based on multi-scale strip convolution aggregation-Reference-Cited by-同舟云学术

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Automated catastrophic optical damage inspection of semiconductor laser chip based on multi-scale strip convolution aggregation

Published:2024-01-31 Issue:7 Volume:15 Page:3027-3042
ISSN:1868-8071
Container-title:International Journal of Machine Learning and Cybernetics
language:en
Short-container-title:Int. J. Mach. Learn. & Cyber.

Author:

Guo Shuai,Li Dengao,Zhao Jumin,Jia Huayu,Luo Biao,Tang Bao,Lv Yuxiang

Funder

Research and Development Project of Key Core and Common Technology of Shanxi Province

National Major Scientific Research Instrument Development Project of China

Publisher

Springer Science and Business Media LLC

Link

https://link.springer.com/content/pdf/10.1007/s13042-023-02079-y.pdf

Reference51 articles.

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2. Welch DF (2000) A brief history of high-power semiconductor lasers. IEEE J Sel Top Quantum Electron 6(6):1470–1477

3. Yun SH, Boudoux C, Pierce MC, Boer JF, Tearney GJ, Bouma BE (2004) Extended-cavity semiconductor wavelength-swept laser for biomedical imaging. IEEE Photonics Technol Lett 16(1):293–295

4. Yoshida M, De Zoysa M, Ishizaki K, Tanaka Y, Kawasaki M, Hatsuda R, Song B, Gelleta J, Noda S (2019) Double-lattice photonic-crystal resonators enabling high-brightness semiconductor lasers with symmetric narrow-divergence beams. Nat Mater 18(2):121–128

5. Li L, Xie Y, Liu B, Xiao Y, Ye Y, Song T, Zhang Y, Liu Y (2019) Optical image encryption and transmission with semiconductor lasers. Opt Laser Technol 119:105616

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1. COD-YOLO: An Efficient YOLO-Based Detector for Laser Chip Catastrophic Optical Damage Defect Detection;Arabian Journal for Science and Engineering;2024-07-31

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