Development of an Automatic Stencil Inspection System Using Modified Hough Transform and Fuzzy Logic-Reference-Cited by-同舟云学术

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Development of an Automatic Stencil Inspection System Using Modified Hough Transform and Fuzzy Logic

Published:2007-02 Issue:1 Volume:54 Page:604-611
ISSN:0278-0046
Container-title:IEEE Transactions on Industrial Electronics
language:
Short-container-title:IEEE Trans. Ind. Electron.

Author:

Choi Kyung-Jin,Lee Young-Hyun,Moon Jong-Woo,Park Chong-Kug,Harashima Fumio

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx5/41/4084635/04084675.pdf?arnumber=4084675

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