Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence,Industrial and Manufacturing Engineering,Software
Reference21 articles.
1. Ben-Gal I. (2006) Outlier detection. In: Maimon O., Rokach L. (eds) Data mining and knowledge discovery handbook: A complete guide for practitioners and researchers. Springer, US, New York, pp 131–146
2. Bergeret F., Le Gall C. (2003) Yield improvement using statistical analysis of process dates. IEEE Transactions on Semiconductor Manufacturing 16: 535–542
3. Chang P. C., Fan C. Y., Wang Y. W. (2009) Evolving CBR and data segmentation by SOM for flow time prediction in semiconductor manufacturing factory. Journal of Intelligent Manufacturing 20(4): 421–429
4. Chen T., Wang Y. C., Wu H. C. (2009) A fuzzy-neural approach for remaining cycle time estimation in a semiconductor manufacturing factory—A simulation study. International Journal of Innovative Computing, Information and Control 5(8): 2125–2140
5. Choudhary A. K., Harding J. A., Tiwari M. K. (2009) Data mining in manufacturing: A review based on the kind of knowledge. Journal of Intelligent Manufacturing 20(5): 501–521
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