Ensemble Bayesian Network for root cause analysis of product defects via learning from historical production data
-
Published:2024-08
Issue:
Volume:75
Page:102-115
-
ISSN:0278-6125
-
Container-title:Journal of Manufacturing Systems
-
language:en
-
Short-container-title:Journal of Manufacturing Systems
Author:
Wang Karen,
Liu ChaoORCID,
Lu YuqianORCID
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献