In-situ ellipsometry studies of adsorption of Hg on CdTe(211)B/Si(211) and molecular beam epitaxy growth of HgCdTe(211)B-Reference-Cited by-同舟云学术

In-situ ellipsometry studies of adsorption of Hg on CdTe(211)B/Si(211) and molecular beam epitaxy growth of HgCdTe(211)B

Published:2004-06 Issue:6 Volume:33 Page:583-589
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Badano G.,Chang Y.,Garland J. W.,Sivananthan S.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-004-0050-9.pdf

Reference10 articles.

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2. For this section, we are very grateful to Professor Dr. G. Meyer-Ehmsen for the helpful discussions, and we quote some of his results with his permission.

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4. D.E. Aspnes, J.B. Theeten, and F. Hottier, Phys. Rev. B 20, 3292 (1979).

5. E.D. Palik, ed., Handbook of Optical Constants (New York: Academic Press, 1985).

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