Surface roughness estimation of MBE grown CdTe/GaAs(211)B by ex-situ spectroscopic ellipsometry
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4959223
Reference31 articles.
1. Spectroscopic Ellipsometry
2. Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces
3. Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
4. Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films
5. Spectroscopic ellipsometry studies of thin film CdTe and CdS: From dielectric functions to solar cell structures
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Nucleation and islands growth of CdZnTe(0 0 1) epitaxial films on GaAs(0 0 1) substrates by close spaced sublimation;Journal of Crystal Growth;2018-09
2. Reciprocal space mapping study of CdTe epilayer grown by molecular beam epitaxy on (2 1 1)B GaAs substrate;Materials Research Express;2017-03-15
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