Probing Phase Transformations and Microstructural Evolutions at the Small Scales: Synchrotron X-ray Microdiffraction for Advanced Applications in 3D IC (Integrated Circuits) and Solar PV (Photovoltaic) Devices-Reference-Cited by-同舟云学术

Probing Phase Transformations and Microstructural Evolutions at the Small Scales: Synchrotron X-ray Microdiffraction for Advanced Applications in 3D IC (Integrated Circuits) and Solar PV (Photovoltaic) Devices

Published:2016-10-21 Issue:12 Volume:45 Page:6222-6232
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Radchenko I.,Tippabhotla S. K.,Tamura N.,Budiman A. S.

Funder

National Research Foundation Singapore

SUTD-MIT International Design Center (IDC)

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-016-5012-5.pdf

Reference33 articles.

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2. X. Chen, N. Tamura, A. MacDowell, and R.D. James, Appl. Phys. Lett. 108, 211902 (2016).

3. A. Budiman, K.R. Narayanan, N. Li, J. Wang, N. Tamura, M. Kunz, and A. Misra, Mater. Sci. Eng. A 635, 6 (2015).

4. A. Budiman, P. Besser, C. Hau-Riege, A. Marathe, Y.C. Joo, N. Tamura, J. Patel, and W. Nix, J. Electron. Mater. 38, 379 (2009).

5. A. Budiman, C. Hau-Riege, W. Baek, C. Lor, A. Huang, H. Kim, G. Neubauer, J. Pak, P. Besser, and W. Nix, J. Electron. Mater. 39, 2483 (2010).

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