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Electromigration-Induced Plasticity: Texture Correlation and Implications for Reliability Assessment

  • Published:2008-12-12 Issue:3 Volume:38 Page:379-391
  • ISSN:0361-5235
  • Container-title:Journal of Electronic Materials
  • language:en
  • Short-container-title:Journal of Elec Materi

Author:

Budiman A.S.,Besser P.R.,Hau-Riege C.S.,Marathe A.,Joo Y.-C.,Tamura N.,Patel J.R.,Nix W.D.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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4. Stress evolution in silicon nanowires during electrochemical lithiation using in situ synchrotron X-ray microdiffraction;Journal of Materials Research;2019-03-04

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