In-situ characterization of highly reversible phase transformation by synchrotron X-ray Laue microdiffraction-Reference-Cited by-同舟云学术

In-situ characterization of highly reversible phase transformation by synchrotron X-ray Laue microdiffraction

Author:

Chen Xian¹²^ORCID,Tamura Nobumichi²^ORCID,MacDowell Alastair²,James Richard D.³

Affiliation:

1. Department of Mechanical and Aerospace Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong

2. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

3. Department of Aerospace Engineering and Mechanics, University of Minnesota, Minneapolis, Minnesota 55455, USA

Funder

Office of Naval Research (ONR)

Office of International Science and Engineering (OISE)

Air Force Office of Scientific Research (AFOSR)

Research Grants Council, University Grants Committee (RGC, UGC)

Lawrence Berkeley National Laboratory (Berkeley Lab)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

Reference23 articles.

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