1. Basile, D., Boylan, R., Baker, B., Hayes, K., and Soza, D., 1992. “FIBXTEM-focused ion beam milling for TEM sample preparation,” Mat. Res. Soc. Symp. Proc. 254 (1992) 23
2. Benninghoven, A., Rudenauer, F.G., Werner, H.W., “Secondary Ion Mass Spectrometry,” J. Wiley and Sons, Inc. New York, NY (1987)
3. Crow, G. A. Ph.D. Thesis, “Focused Ion Beam Micromachining of Si and GaAs Using Ga and Áu Liquid Metal Ion Sources,” Oregon Graduate Institute, Beaverton, OR (1990)
4. Blauner, P., Butt, Y., Ro, J., Thompson, C., Melngailis, J., “ Focused ion beam induced deposition of low resistivity gold films,” J. Vac. Sci. Technol. B7 (1989) 816
5. Boylan, R., Ward, M. and Tuggle, D., “Failure analysis of micron technology VLSI using focused ion beams,” Proc. Int. Sym. For Testing and Failure Analysis (ASM International, Los Angeles) (1989) 249