Proposed Methods for Depth Profiling of Residual Stresses using Grazing Incidence X-Ray Diffraction (GIXD)-Reference-Cited by-同舟云学术

Proposed Methods for Depth Profiling of Residual Stresses using Grazing Incidence X-Ray Diffraction (GIXD)

Published:1993 Issue: Volume: Page:237-245
ISSN:
Container-title:Advances in X-Ray Analysis
language:
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Author:

Predecki Paul,Zhu X.,Ballard B.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-2972-9_28.pdf

Reference30 articles.

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4. Dolle, H., J. Appl. Cryst. 12, 489–501 (1979).

5. Eigenmann, B., Scholtes. B. and Macherauch, E., Mater. Sci. and Eng. A118, 1–17 (1989).

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