New Developments of Multireflection Grazing Incidence Diffraction

Abstract

The multireflection grazing incident X-ray diffraction (MGIXD) is used to determine a stress gradient in thin surface layers (about 1-20 μm for metals). In this work two theoretical developments of this method are presented. The first procedure enables determination of c/a parameter in hexagonal polycrystalline materials exhibiting residual stresses. In the second method, the influence of stacking faults on the experimental data is considered. The results of both procedures were verified using X-rays diffraction.