Residual Stress Analysis by X-Ray Diffraction Methods-Reference-Cited by-同舟云学术

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Residual Stress Analysis by X-Ray Diffraction Methods

Published:2013-01-14 Issue: Volume: Page:127-154
ISSN:
Container-title:Modern Diffraction Methods
language:
Short-container-title:

Author:

Genzel Christoph,Denks Ingwer A.,Klaus Manuela

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/9783527649884.ch5/fullpdf

Reference51 articles.

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A study of stress, composition and grain interaction gradients in energy-dispersive X-ray stress analysis on materials with cubic symmetry;Journal of Applied Crystallography;2024-06-07

2. Energy-dispersive X-ray stress analysis under geometric constraints: exploiting the material's inherent anisotropy;Journal of Applied Crystallography;2023-04-01

3. A novel approach for nondestructive depth-resolved analysis of residual stress and grain interaction in the near-surface zone applied to an austenitic stainless steel sample subjected to mechanical polishing;Measurement;2022-05

4. Data-driven analysis of neutron diffraction line profiles: application to plastically deformed Ta;Scientific Reports;2022-04-04

5. Strain depth profiles in thin films extracted from in-plane X-ray diffraction;Journal of Applied Crystallography;2021-02-01

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