Individual Interface Traps and Telegraph Noise
Author:
Mueller H. H.,Schulz M.
Reference35 articles.
1. Farmer, K. R., C. T. Rogers, and R. A. Buhrmann, Phys. Rev. Lett., 58, 2255 (1987). 2. Weiland, M. B., and R. H. Koch, Appl. Phys. Lett, 48, 724 (1986). 3. Peng, L. L., P. C. Canfield and D. A. Allstot, IEEE Trans. Electron Devices, ED-39, 2444 (1992). 4. Kirton. M. J., and M. J. Uren, Advances in Physics, 38, No. 4, 367 (1989). 5. Ralls, K. S., W. J. Skocpol, L. D. Jackel, R. E. Howard, L. A. Fetter, R. W. Epworth and D. M. Tennant, Phys. Rev. Lett, 52, 228 (1984).
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