Photoexcitation of electron-hole pairs during SIMS-Reference-Cited by-同舟云学术

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Photoexcitation of electron-hole pairs during SIMS

Published:1989-09 Issue:3 Volume:49 Page:279-283
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Kempf J.,Nonnenmacher M.,Wagner H. H.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00616855.pdf

Reference16 articles.

1. J.A. McHugh:Methods and Phenomena 1, ed. by A.W. Czanderna (Elsevier, New York 1973)

2. G. Kaus, J.E. Kempf: In Proc. 7th Int. Vac. Congr. & 3rd Int. Conf. Solid Surf., Vienna 1977, 2277

3. J. Kempf, M. Nonnenmacher, H.H. Wagner: Appl. Phys. A47, 137 (1988)

4. J. Kempf, H.H. Wagner:Topics Curr. Phys. 37 (Springer, Berlin, Heidelberg 1984) p. 87

5. J. Kempf, G. Kaus: Appl. Phys.13, 261 (1977)

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials;Applied Surface Science;2006-07

2. Electron and ion beam induced heating effects in solids measured by laser interferometry;Applied Physics A Solids and Surfaces;1993-04

3. Energy dependence of ion induced electron yields of aluminium and silicon bombarded with Ne+, O+, and O2+;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-06

4. Correlation between the O+2induced electron emission coefficient and the removal rate of Cu impurities segregated at the SiO2/Si interface;Applied Physics Letters;1991-05-13

5. Atomic Spectrometry Update—Inorganic Mass Spectrometry and X-Ray Fluorescence Spectrometry;J. Anal. At. Spectrom.;1990

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