Thin film characterization by laser interferometry combined with SIMS-Reference-Cited by-同舟云学术

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Thin film characterization by laser interferometry combined with SIMS

Published:1988-10 Issue:2 Volume:47 Page:137-145
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Kempf J.,Nonnenmacher M.,Wagner H. H.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00618878.pdf

Reference30 articles.

1. O.S. Heavens: InPhysics of Thin Films ed. by G. Hass, R.E. Thun (Academic, New York 1964) p. 193

2. E.D. Palik:Handbook of Optical Constants of Solids (Academic, New York 1985)

3. A.W. Czanderna (ed.):Methods of Surface Analysis (Elsevier, New York 1975)

4. 37,1984

5. 47 and 52,1981

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