Author:
Castano Victor,Schagaev Igor
Publisher
Springer International Publishing
Reference68 articles.
1. Abramovici M, Breuer MA (1979) On redundancy and fault detection in sequential circuits. IEEE Trans Comput 28:864–865
2. Abramovici M, Breuer MA, Friedman AD (1994) Digital systems testing & testable design, 1st edn. Wiley-IEEE, Hoboken NJ
3. Agrawal VD, Chakradhar ST (1995) Combinational ATPG theorems for identifying untestable faults in sequential circuits. IEEE Trans Comput Aided Des Integrated Circ Syst 14:1155–1160
4. Alam M, et al (2007) Characterization and Estimation of Circuit Reliability Degradation under NBTI using Proc On-Line IDDQ Measurement, Proc. Design Automation Conference
5. Anderson T, Lee PA (1981) Fault tolerance: principles and practice. Prentice-Hall, Englewood Cliffs, NJ