Author:
Abdelrahman Omer H.,Gelenbe E.
Publisher
Springer International Publishing
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility;2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2019-11
2. Technology Scaling Roadmap for FinFET-Based FPGA Clusters Under Process Variations;Journal of Circuits, Systems and Computers;2017-12-06
3. RANDOM NEURAL NETWORK LEARNING HEURISTICS;Probability in the Engineering and Informational Sciences;2017-05-22