Author:
Zimpeck Alexandra L.,Meinhardt Cristina,Artola Laurent,Hubert Guillaume,Kastensmidt Fernanda L.,Reis Ricardo
Cited by
3 articles.
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1. Process Variability Mitigation;Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs;2021
2. Circuit design using Schmitt Trigger to reliability improvement;Microelectronics Reliability;2020-11
3. Circuit Level Design Methods to Mitigate Soft Errors;2020 IEEE Latin-American Test Symposium (LATS);2020-03