Author:
Shirakura Yudai,Segawa Taisei,Shibata Yuichiro,Morimoto Kenichi,Tanaka Masaharu,Nobe Masanori,Maruta Hidenori,Kurokawa Fujio
Publisher
Springer International Publishing
Reference9 articles.
1. International Electrotechnical Commission: Functional safety of electrical/electronic/programmable electronic safety related systems, IEC 61508 (2000)
2. Lecture Notes in Computer Science;Y Ichinomiya,2009
3. Hayek, A., Al-Bokhaiti, M., Borcsok, J.: Design and inplementation of an FPGA-based 1oo4-archtecture for safety-related system-on-chip. In: Proceedings of IEEE 25th International Confierence on Microelectronices(ICM), pp. 1–4 (2013)
4. Bolchini, C., Miele, A., Santambrogio, M.D.: TMR and partial dynamic reconfiguration to mitigate SEU faults in FPGAs. In: Proceedings of 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007, pp. 87–95. IEEE (2007)
5. Lecture Notes in Computer Science;A Kanamaru,2009
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献