Funder
National Natural Science Foundation of China
State Key Laboratory of Particle Detection and Electronics
National Key Research and Development Project of China
Publisher
Springer Science and Business Media LLC
Subject
Nuclear Energy and Engineering,Nuclear and High Energy Physics
Reference8 articles.
1. M. Weng, M. Cao, H.-J. Zhao, H.-B. Zhang, A simple charge neutralization method for measuring the secondary electron yield of insulators. Rev. Sci. Instrum. 85(3), 036108 (2014)
2. I. Krainsky, W. Lundin, W. Gordon, R. Hoffman, Secondary electron emission yields (1981), pp. 179–197
3. Y. Bozhko, J. Barnard, N. Hilleret, Measurements of the secondary electron emission of some insulators. arXiv preprint arXiv:1302.2333
4. A. Bass, P. Cloutier, L. Sanche, Measurements of charge accumulation induced by monochromatic low-energy electrons at the surface of insulating samples. J. Appl. Phys. 84(5), 2740–2748 (1998)
5. K. Wen, S. Liu, B. Yan, Y. Yu, Y. Yang, Spherical Measuring Device of Secondary Electron Emission Coefficient Based on Pulsed Electron Beam. In: Liu ZA. (eds) International Conference on Technology and Instrumentation in Particle Physics TIPP (2017). Springer Proceedings in Physics, vol 212. Springer, Singapore
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献