Author:
Wen Kaile,Liu Shulin,Yan Baojun,Yu Yang,Yang Yuzhen
Reference5 articles.
1. Jokela, S.J., Veryovkin, I.V., Zinovev, A.V.: Secondary electron yield of emissive materials for large-area micro-channel plate detectors: surface composition and film thickness dependencies. Phys. Procedia 37, 740–747 (2012)
2. Shih, A., Hor, C.: Secondary emission properties as a function of the electron incidence angle. IEEE Trans. Electron Devices 40(4) (1993)
3. Kirby, R.E., King, F.K.: Secondary electron emission yields from PEP-II accelerator materials. Nucl. Instrum. Methods Phys. Res. A 469, 1–12 (2001)
4. Suharyanto, Yamano, Y., Kobayashi, S., Michizono, S., Saito, Y.: Effect of mechanical finishes on secondary electron emission of alumina ceramics. IEEE Trans. Dielectr. Electr. Insul. 14(3) (2007)
5. Yang, W.J., Li, Y.D., Liu, C.L.: Model of secondary electron emission at high incident electron energy for metal. Acta Phys. Sin. 62(8), 087901 (2013)
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