Near-optimal tests for classes of write-triggered coupling faults in RAMs-Reference-Cited by-同舟云学术

Near-optimal tests for classes of write-triggered coupling faults in RAMs

Published:1992-08 Issue:3 Volume:3 Page:251-264
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Cockburn B. F.,Brzozowski J. A.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00134734.pdf

Reference15 articles.

1. J. Cocking, ?RAM test patterns and test strategy?, Dig. of Papers, 1975 Semicond. Test Symp., Cherry Hill, NJ, pp. 1?8, October 14?16, 1975.

2. S.M. Thatte and J.A. Abraham, ?Testing of semiconductor random access memories?, Dig. of Papers, 7th Int. Conf. on Fault-Tolerant Computing, Los Angeles, pp. 81?87, June 28?30, 1977.

3. R. Nair, S.M. Thatte, and J.A. Abraham, ?Efficient algorithms for testing semiconductor random-access memories?, IEEE Trans. on Comp., vol. C-27, pp. 572?576, June 1978.

4. Ph.D. thesis;D.S. Suk,1978

5. D.S. Suk and S.M. Reddy, ?A march test for functional faults in semiconductor random access memories?, IEEE Trans. on Comp., vol. C-30, pp. 982?985, December 1981.

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