Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference42 articles.
1. G. Antonin, H.-D. Oberle, and J. Kolzer ?Electrical Characterization of Megabit DRAMs,?IEEE Design & Test of Computers, vol. 8, pp. 36?43, September 1991
2. C.R. Barret and R.C. Smith, ?Failure Modes and Reliability of Dynamic RAMs,?Tech. Dig. 1976 Int. Electron Devices Meeting, Washington, DC, pp. 319?322, December 6?8, 1976.
3. D.C. Bossen and M.Y. Hsiao, ?A System Solution to the Memory Soft Error Problem,?IBM J. Res. Develop., vol. 24, pp. 390?397, May 1980.
4. J.A. Brzozowski and B.F. Cockburn, ?Detection of Coupling Faults in RAMs,?J. of Electronic Testing: Theory and Applications, vol. 1, pp. 151?162, May 1990.
5. D. Bursky, ?Fast DRAMs can be swapped for SRAM Caches,?Electronic Design, vol. 42, no. 15 pp. 55?70, July 22, 1993.
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