Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Fault Detection and Repair-Reference-Cited by-同舟云学术

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Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Fault Detection and Repair

Published:2010-07 Issue: Volume: Page:
ISSN:
Container-title:2010 IEEE Computer Society Annual Symposium on VLSI
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Author:

Sharma R.K.,Sood Aditi

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5570021/5571793/05572810.pdf?arnumber=5572810

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Built-in Diagnostic Approaches for a Static Random Access Memory;2021 IEEE International Conference on Sensors and Nanotechnology (SENNANO);2021-09-22

2. ML-Based Aging Monitoring and Lifetime Prediction of IoT Devices with Cost-Effective Embedded Tags for Edge and Cloud Operability;IEEE Internet of Things Journal;2021

3. Design of Modified March-C Algorithm and Built-in self-test architecture for Memories;3C Tecnología_Glosas de innovación aplicadas a la pyme;2020-03-23

4. A Hardware-assisted Heartbeat Mechanism for Fault Identification in Large-scale IoT Systems;IEEE Transactions on Dependable and Secure Computing;2020

5. Hardware-Based Online Self-Diagnosis for Faulty Device Identification in Large-Scale IoT Systems;2018 IEEE/ACM Third International Conference on Internet-of-Things Design and Implementation (IoTDI);2018-04

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